EVALUATING RELIABILITY OF ELECTRONIC COMPONENTS IN VEHICLES BY ACCELERATED RELIABILITY TESTING

Abstract

This paper presents an accelerated reliability testing method for evaluating the reliability of electronic components. Due to their gradually common applications in vehicles, light-emitting diodes are used to conduct experiments. In these tests, temperature and humidity are the two genres of environmental stress considered. While the former type is the accelerated stress (at 70°C, 90°C and 100°C), the later is kept under normal operating conditions (80% RH). The research indicates that accelerated reliability testing is a suitable method to quickly obtain reliability parameters of electronic components. Besides, for electronic components that show degradation characteristics during the test, test duration, as well as expenditure, can be lower by testing obtaining degradation parameters instead of testing until the component is completely broken (test duration has been reduced from over 9400 hours to 2668 hours).