LESSON LEART FROM 500KV CIRCUIT BREAKER FAILURE AND SOLUTION TO IMPROVE CIRCUIT BREAKER LIFETIME OF SHUNT REACTOR

Abstract

The application of controlled switching device (CSD) in order to mitigate influence of transient when energizing/de-energizing reactance loads has been taken into account by electrical utilities. The 500kV circuit breaker is an important and expensive device in the substation. When opening the circuit breaker of a shunt reactor, it is necessary to study and calculate carefully because incorrect control of opening the circuit breaker can lead to re-ignition, which can even cause damage to the circuit breaker. The paper investigates the failure of 500kV circuit breaker at Hiep Hoa 500kV substation and proposes the solutions to reduce the damage of the breaker when opening the shunt reactor in the future.