APPLICATION OF NaI(Tl) - SILICON PHOTOMULTIPLIER (SIPM) GAMMA DETECTOR IN COMPUTED TOMOGRAPHY SETUP WITH SINGLE - SOURCE AND SINGLE-DETECTOR

Abstract

Industrial computed tomography in defect inspection is a technique that uses irradiation to generate 3D images of the internal structure of scanned objects from 2D partial projection images based on image reconstruction algorithms. In particular, the industrial computed tomography system using the NaI(Tl) detector combined with a photomultiplier tube (PMT) has many limitations such as being unusable in environmental conditions with the magnetic field, PMT is very fragile, using high voltage to operate making the measuring system expensive. In order to improve the mechanical strength and adaptability to industrial working conditions of the measuring system, the application of NaI(Tl) detector combined with a silicon photomultiplier (SiPM) in nuclear radiation measurement of the industrial computed tomography system was proposed in this paper. The computed tomography system with single-source and single detector configuration using NaI(Tl)+SiPM detector for the signal acquisition was established at the Electronics Laboratory of the Center for Application of Nuclear technique in Industry. Experimental evaluation of the measurement system is carried out by taking tomographic images of the specimens.